Nts jd-12 ตู้ลำโพง 12" 2 ทาง Table 2 from board level reliability of automotive ewlb (embedded wafer Reliability testing
NTS JD-12 ตู้ลำโพง 12" 2 ทาง
Htol operating temperature
High temperature operating life (htol)
Reliability acceleration failure semiconductor qualification jedec accelerated use .
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